[Source: "High-tech LED - Technology and Applications" February issue]
I. Introduction
The lighting technology using the semiconductor chip as a luminescent material has the advantages of high photoelectric conversion efficiency, energy saving, environmental protection, long life and the like. However, the operating temperature of the LED is greatly affected by the thermal resistance of the LED die itself, the silver paste and the heat dissipation of the substrate. When the operating temperature rises, the luminous efficiency of the LED drops sharply. More seriously, the thermal breakdown caused by poor heat dissipation, the electrostatic breakdown caused by excessive excitation and other factors make the life of LED lamps greatly reduced [1, 2]. Therefore, it is extremely necessary to study the test methods and test techniques for lamp life.
Luminous maintenance rate is an important indicator of the life of a luminaire. Lamp life testing is performed by simulating various usage environments in the laboratory. In order to shorten the test time without changing the failure mechanism, the test is carried out by increasing the stress, which is the accelerated life test [3, 4]. There are two ways to increase stress: increase the input current and increase the ambient temperature. This paper presents a luminaire life tester that can monitor the illuminance and ambient temperature changes as the luminaire stress changes in real time (as shown in Figure 1). The measurement data can be transmitted by wireless communication and stored in the host computer. Test programs are written in the LabVIEW language to meet a variety of needs for analyzing the life characteristics of lamps.
The instrument is mainly composed of two parts: the test black box and the upper computer. Among them, the test black box is used to provide an ideal test environment free from external light. The front of the black box opens, and the upper part is fixed with a suction cup antenna. The inside is equipped with a voltmeter, an ammeter, a voltage/current regulator, a measuring unit, a lamp holder, four illuminance sensors and one temperature sensor. as shown in picture 2.
The voltage/current regulator is used to set the input voltage and current of the luminaire. At the same time, voltmeters and ammeters can detect the input voltage and current of the luminaire to prevent damage to the luminaire caused by overvoltage or overcurrent. The lamp holder is suitable for incandescent lamps, fluorescent lamps, high pressure sodium lamps, mercury lamps, xenon lamps, metal halide lamps and the like.
I. Introduction
The lighting technology using the semiconductor chip as a luminescent material has the advantages of high photoelectric conversion efficiency, energy saving, environmental protection, long life and the like. However, the operating temperature of the LED is greatly affected by the thermal resistance of the LED die itself, the silver paste and the heat dissipation of the substrate. When the operating temperature rises, the luminous efficiency of the LED drops sharply. More seriously, the thermal breakdown caused by poor heat dissipation, the electrostatic breakdown caused by excessive excitation and other factors make the life of LED lamps greatly reduced [1, 2]. Therefore, it is extremely necessary to study the test methods and test techniques for lamp life.
Luminous maintenance rate is an important indicator of the life of a luminaire. Lamp life testing is performed by simulating various usage environments in the laboratory. In order to shorten the test time without changing the failure mechanism, the test is carried out by increasing the stress, which is the accelerated life test [3, 4]. There are two ways to increase stress: increase the input current and increase the ambient temperature. This paper presents a luminaire life tester that can monitor the illuminance and ambient temperature changes as the luminaire stress changes in real time (as shown in Figure 1). The measurement data can be transmitted by wireless communication and stored in the host computer. Test programs are written in the LabVIEW language to meet a variety of needs for analyzing the life characteristics of lamps.
Figure 1 lamp life tester
The instrument is mainly composed of two parts: the test black box and the upper computer. Among them, the test black box is used to provide an ideal test environment free from external light. The front of the black box opens, and the upper part is fixed with a suction cup antenna. The inside is equipped with a voltmeter, an ammeter, a voltage/current regulator, a measuring unit, a lamp holder, four illuminance sensors and one temperature sensor. as shown in picture 2.
The voltage/current regulator is used to set the input voltage and current of the luminaire. At the same time, voltmeters and ammeters can detect the input voltage and current of the luminaire to prevent damage to the luminaire caused by overvoltage or overcurrent. The lamp holder is suitable for incandescent lamps, fluorescent lamps, high pressure sodium lamps, mercury lamps, xenon lamps, metal halide lamps and the like.
Figure 2 Test dark box structure
For more information, please refer to the February issue of "High-tech LED-Technology and Applications" magazine.
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